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Beilstein J. Nanotechnol. 2012, 3, 230–237, doi:10.3762/bjnano.3.26
Figure 1: AFM resolution examples: (a) high resolution UHV NC-AFM image of SiO2 displaying features with radi...
Figure 2: Verification of atom–substrate potential: Potential wa–s versus z for numerical and analytical sche...
Figure 3: Schematic illustrating the model geometry: The surface is sinusoidally corrugated along the x direc...
Figure 4: Hamaker force for flat surfaces: Relationship between tip potential and distance from the surface. ...
Figure 5: Hamaker force law for corrugated surfaces: Tip–sample distance dependence of tip potential for high...
Figure 6: Contours of constant normalized frequency shift, γ, for a corrugated surface. Attenuation is observ...